From Wikipedia, the free encyclopedia
A memristor (; a portmanteau of memory resistor) is a non-linear two-terminal electrical component relating electric charge and magnetic flux linkage. It was described and named in 1971 by Leon Chua, completing a theoretical quartet of fundamental electrical components which comprises also the resistor, capacitor and inductor.
Chua and Kang later generalized the concept to memristive systems.
Such a system comprises a circuit, of multiple conventional
components, which mimics key properties of the ideal memristor component
and is also commonly referred to as a memristor. Several such memristor
system technologies have been developed, notably ReRAM.
The identification of memristive properties in electronic devices
has attracted controversy. Experimentally, the ideal memristor has yet
to be demonstrated.
As a fundamental electrical component
Conceptual symmetries of resistor, capacitor, inductor, and memristor.
Chua in his 1971 paper identified a theoretical symmetry between the
non-linear resistor (voltage vs. current), non-linear capacitor (voltage
vs. charge), and non-linear inductor (magnetic flux linkage vs.
current). From this symmetry he inferred the characteristics of a fourth
fundamental non-linear circuit element, linking magnetic flux and
charge, which he called the memristor. In contrast to a linear (or
non-linear) resistor the memristor has a dynamic relationship between
current and voltage including a memory of past voltages or currents.
Other scientists had proposed dynamic memory resistors such as the memistor of Bernard Widrow, but Chua introduced a mathematical generality.
Derivation and characteristics
The memristor was originally defined in terms of a non-linear functional relationship between magnetic flux linkage Φm(t) and the amount of electric charge that has flowed, q(t):
The magnetic flux linkage, Φm, is generalized from the circuit characteristic of an inductor. It does not represent a magnetic field here. Its physical meaning is discussed below. The symbol Φm may be regarded as the integral of voltage over time.
In the relationship between Φm and q, the derivative
of one with respect to the other depends on the value of one or the
other, and so each memristor is characterized by its memristance
function describing the charge-dependent rate of change of flux with
charge.
Substituting the flux as the time integral of the voltage, and charge
as the time integral of current, the more convenient forms are;
To relate the memristor to the resistor, capacitor, and inductor, it is helpful to isolate the term M(q), which characterizes the device, and write it as a differential equation.
Device |
Characteristic property (units) |
Differential equation
|
Resistor (R) |
Resistance (V / A, or ohm, Ω) |
R = dV / dI
|
Capacitor (C) |
Capacitance (C / V, or farad) |
C = dq / dV
|
Inductor (L) |
Inductance (Wb / A, or henry) |
L = dΦm / dI
|
Memristor (M) |
Memristance (Wb / C, or ohm) |
M = dΦm / dq
|
The above table covers all meaningful ratios of differentials of I, q, Φm, and V. No device can relate dI to dq, or dΦm to dV, because I is the derivative of q and Φm is the integral of V.
It can be inferred from this that memristance is charge-dependent resistance. If M(q(t)) is a constant, then we obtain Ohm's Law R(t) = V(t)/I(t). If M(q(t)) is nontrivial, however, the equation is not equivalent because q(t) and M(q(t)) can vary with time. Solving for voltage as a function of time produces
This equation reveals that memristance defines a linear relationship between current and voltage, as long as M does not vary with charge. Nonzero current implies time varying charge. Alternating current,
however, may reveal the linear dependence in circuit operation by
inducing a measurable voltage without net charge movement—as long as the
maximum change in q does not cause much change in M.
Furthermore, the memristor is static if no current is applied. If I(t) = 0, we find V(t) = 0 and M(t) is constant. This is the essence of the memory effect.
Analogously, we can define a as menductance.
The power consumption characteristic recalls that of a resistor, I2R.
As long as M(q(t)) varies little, such as under alternating current, the memristor will appear as a constant resistor. If M(q(t)) increases rapidly, however, current and power consumption will quickly stop.
M(q) is physically restricted to be positive for all values of q (assuming the device is passive and does not become superconductive at some q). A negative value would mean that it would perpetually supply energy when operated with alternating current.
Modelling and validation
In
order to understand the nature of memristor function, some knowledge of
fundamental circuit theoretic concepts is useful, starting with the
concept of device modelling.
Engineers and scientists seldom analyze a physical system in its
original form. Instead, they construct a model which approximates the
behaviour of the system. By analyzing the behaviour of the model, they
hope to predict the behaviour of the actual system. The primary reason
for constructing models is that physical systems are usually too complex
to be amenable to a practical analysis.
In the 20th century, work was done on devices where researchers
did not recognize the memristive characteristics. This has raised the
suggestion that such devices should be recognised as memristors. Pershin and Di Ventra
have proposed a test that can help to resolve some of the long-standing
controversies about whether an ideal memristor does actually exist or
is a purely mathematical concept.
The rest of this article primarily addresses memristors as related to ReRAM devices, since the majority of work since 2008 has been concentrated in this area.
Superconducting memristor component
Dr. Paul Penfield, in a 1974 MIT technical report
mentions the memristor in connection with Josephson junctions. This
was an early use of the word "memristor" in the context of a circuit
device.
One of the terms in the current through a Josephson junction is of the form:
where is a constant based on the physical superconducting materials, is the voltage across the junction and is the current through the junction.
Through the late 20th century, research regarding this phase-dependent conductance in Josephson junctions was carried out.
A more comprehensive approach to extracting this phase-dependent
conductance appeared with Peotta and DiVentra's seminal paper in 2014.
Memristor circuits
Due
to the practical difficulty of studying the ideal memristor, we will
discuss other electrical devices which can be modelled using memristors.
For a mathematical description of a memristive device (systems), see Theory.
A discharge tube can be modelled as a memristive device, with resistance being a function of the number of conduction electrons .
is the voltage across the discharge tube, is the current flowing through it and is the number of conduction electrons. A simple memristance function is . and are parameters depending on the dimensions of the tube and the gas fillings. An experimental identification of memristive behaviour is the "pinched hysteresis loop" in the plane. For an experiment that shows such a characteristic for a common discharge tube, see "A physical memristor Lissajous figure" (YouTube). The video also illustrates how to understand deviations in the pinched hysteresis characteristics of physical memristors.
Thermistors can be modelled as memristive devices.
is a material constant, is the absolute body temperature of the thermistor, is the ambient temperature (both temperatures in Kelvin), denotes the cold temperature resistance at , is the heat capacitance and is the dissipation constant for the thermistor.
A fundamental phenomenon that has hardly been studied is memristive behaviour in pn-junctions.
The memristor plays a crucial role in mimicking the charge storage
effect in the diode base, and is also responsible for the conductivity
modulation phenomenon (that is so important during forward transients).
Criticisms
In 2008, a team at HP Labs claimed to have found Chua's missing memristor based on an analysis of a thin film of titanium dioxide, thus connecting the operation of ReRAM devices to the memristor concept. According to HP Labs, the memristor would operate in the following way: the memristor's electrical resistance
is not constant but depends on the current that had previously flowed
through the device, i.e., its present resistance depends on how much
electric charge has previously flowed through it and in what direction;
the device remembers its history—the so-called non-volatility property. When the electric power supply is turned off, the memristor remembers its most recent resistance until it is turned on again.
The HP Labs result was published in the scientific journal Nature.
Following this claim, Leon Chua has argued that the memristor definition
could be generalized to cover all forms of two-terminal non-volatile
memory devices based on resistance switching effects. Chua also argued that the memristor is the oldest known circuit element, with its effects predating the resistor, capacitor, and inductor. There are, however, some serious doubts as to whether a genuine memristor can actually exist in physical reality. Additionally, some experimental evidence contradicts Chua's generalization since a non-passive nanobattery effect is observable in resistance switching memory. A simple test has been proposed by Pershin and Di Ventra
to analyze whether such an ideal or generic memristor does actually
exist or is a purely mathematical concept. Up to now, there seems to be
no experimental resistance switching device (ReRAM) which can pass the test.
These devices are intended for applications in nanoelectronic memory devices, computer logic, and neuromorphic/neuromemristive computer architectures. In 2013, Hewlett-Packard CTO Martin Fink suggested that memristor memory may become commercially available as early as 2018. In March 2012, a team of researchers from HRL Laboratories and the University of Michigan announced the first functioning memristor array built on a CMOS chip.
According to the original 1971 definition, the memristor is the
fourth fundamental circuit element, forming a non-linear relationship
between electric charge and magnetic flux linkage. In 2011, Chua argued for a broader definition that includes all 2-terminal non-volatile memory devices based on resistance switching. Williams argued that MRAM, phase-change memory and ReRAM are memristor technologies. Some researchers argued that biological structures such as blood and skin fit the definition. Others argued that the memory device under development by HP Labs and other forms of ReRAM are not memristors, but rather part of a broader class of variable-resistance systems, and that a broader definition of memristor is a scientifically unjustifiable land grab that favored HP's memristor patents.
In 2011, Meuffels and Schroeder noted that one of the early
memristor papers included a mistaken assumption regarding ionic
conduction. In 2012, Meuffels and Soni discussed some fundamental issues and problems in the realization of memristors. They indicated inadequacies in the electrochemical modeling presented in the Nature article "The missing memristor found" because the impact of concentration polarization effects on the behavior of metal−TiO2−x−metal structures under voltage or current stress was not considered. This critique was referred to by Valov et al. in 2013.
In a kind of thought experiment, Meuffels and Soni furthermore revealed a severe inconsistency: If a current-controlled memristor with the so-called non-volatility property exists in physical reality, its behavior would violate Landauer's principle,
which places a limit on the minimum amount of energy required to change
"information" states of a system. This critique was finally adopted by Di Ventra and Pershin in 2013.
Within this context, Meuffels and Soni pointed to a fundamental thermodynamic principle: Non-volatile information storage requires the existence of free-energy
barriers that separate the distinct internal memory states of a system
from each other; otherwise, one would be faced with an "indifferent"
situation, and the system would arbitrarily fluctuate from one memory
state to another just under the influence of thermal fluctuations. When unprotected against thermal fluctuations, the internal memory states exhibit some diffusive dynamics, which causes state degradation. The free-energy barriers must therefore be high enough to ensure a low bit-error probability of bit operation. Consequently, there is always a lower limit of energy requirement – depending on the required bit-error probability – for intentionally changing a bit value in any memory device.
In the general concept of memristive system the defining equations are (see Theory):
where u(t) is an input signal, and y(t) is an output signal. The vector x represents a set of n state variables describing the different internal memory states of the device. ẋ is the time-dependent rate of change of the state vector x with time.
When one wants to go beyond mere curve fitting and aims at a real physical modeling of non-volatile memory elements, e.g., resistive random-access memory
devices, one has to keep an eye on the aforementioned physical
correlations. To check the adequacy of the proposed model and its
resulting state equations, the input signal u(t) can be superposed with a stochastic term ξ(t), which takes into account the existence of inevitable thermal fluctuations. The dynamic state equation in its general form then finally reads:
where ξ(t) is, e.g., white Gaussian current or voltage noise.
On base of an analytical or numerical analysis of the time-dependent
response of the system towards noise, a decision on the physical
validity of the modeling approach can be made, e.g., would the system be
able to retain its memory states in power-off mode?
Such an analysis was performed by Di Ventra and Pershin
with regard to the genuine current-controlled memristor. As the
proposed dynamic state equation provides no physical mechanism enabling
such a memristor to cope with inevitable thermal fluctuations, a
current-controlled memristor would erratically change its state in
course of time just under the influence of current noise. Di Ventra and Pershin
thus concluded that memristors whose resistance (memory) states depend
solely on the current or voltage history would be unable to protect
their memory states against unavoidable Johnson–Nyquist noise
and permanently suffer from information loss, a so-called "stochastic
catastrophe". A current-controlled memristor can thus not exist as a
solid-state device in physical reality.
The above-mentioned thermodynamic principle furthermore implies
that the operation of 2-terminal non-volatile memory devices (e.g.
"resistance-switching" memory devices (ReRAM))
cannot be associated with the memristor concept, i.e., such devices
cannot by itself remember their current or voltage history. Transitions
between distinct internal memory or resistance states are of probabilistic nature. The probability for a transition from state {i} to state {j}
depends on the height of the free-energy barrier between both states.
The transition probability can thus be influenced by suitably driving
the memory device, i.e., by "lowering" the free-energy barrier for the
transition {i} → {j} by means of, for example, an externally applied bias.
A "resistance switching" event can simply be enforced by setting
the external bias to a value above a certain threshold value. This is
the trivial case, i.e., the free-energy barrier for the transition {i} → {j}
is reduced to zero. In case one applies biases below the threshold
value, there is still a finite probability that the device will switch
in course of time (triggered by a random thermal fluctuation), but – as
one is dealing with probabilistic processes – it is impossible to
predict when the switching event will occur. That is the basic reason
for the stochastic nature of all observed resistance-switching (ReRAM) processes. If the free-energy barriers are not high enough, the memory device can even switch without having to do anything.
When a 2-terminal non-volatile memory device is found to be in a distinct resistance state {j},
there exists therefore no physical one-to-one relationship between its
present state and its foregoing voltage history. The switching behavior
of individual non-volatile memory devices thus cannot be described
within the mathematical framework proposed for memristor/memristive
systems.
An extra thermodynamic curiosity arises from the definition that
memristors/memristive devices should energetically act like resistors.
The instantaneous electrical power entering such a device is completely
dissipated as Joule heat to the surrounding, so no extra energy remains in the system after it has been brought from one resistance state xi to another one xj. Thus, the internal energy of the memristor device in state xi, U(V, T, xi), would be the same as in state xj, U(V, T, xj),
even though these different states would give rise to different
device's resistances, which itself must be caused by physical
alterations of the device's material.
Other researchers noted that memristor models based on the assumption of linear ionic drift
do not account for asymmetry between set time (high-to-low resistance
switching) and reset time (low-to-high resistance switching) and do not
provide ionic mobility values consistent with experimental data.
Non-linear ionic-drift models have been proposed to compensate for this
deficiency.
A 2014 article from researchers of ReRAM
concluded that Strukov's (HP's) initial/basic memristor modeling
equations do not reflect the actual device physics well, whereas
subsequent (physics-based) models such as Pickett's model or Menzel's
ECM model (Menzel is a co-author of that article) have adequate
predictability, but are computationally prohibitive. As of 2014, the
search continues for a model that balances these issues; the article
identifies Chang's and Yakopcic's models as potentially good
compromises.
Martin Reynolds, an electrical engineering analyst with research outfit Gartner,
commented that while HP was being sloppy in calling their device a
memristor, critics were being pedantic in saying that it was not a
memristor.
Experimental tests
Chua suggested experimental tests to determine if a device may properly be categorized as a memristor:
- The Lissajous curve in the voltage-current plane is a pinched hysteresis loop when driven by any bipolar periodic voltage or current without respect to initial conditions.
- The area of each lobe of the pinched hysteresis loop shrinks as the frequency of the forcing signal increases.
- As the frequency tends to infinity, the hysteresis loop degenerates
to a straight line through the origin, whose slope depends on the
amplitude and shape of the forcing signal.
According to Chua all resistive switching memories including ReRAM, MRAM and phase-change memory
meet these criteria and are memristors. However, the lack of data for
the Lissajous curves over a range of initial conditions or over a range
of frequencies complicates assessments of this claim.
Experimental evidence shows that redox-based resistance memory (ReRAM) includes a nanobattery
effect that is contrary to Chua's memristor model. This indicates that
the memristor theory needs to be extended or corrected to enable
accurate ReRAM modeling.
Theory
In 2008 researchers from HP Labs introduced a model for a memristance function based on thin films of titanium dioxide. For RON ≪ ROFF the memristance function was determined to be
where ROFF represents the high resistance state, RON represents the low resistance state, μv represents the mobility of dopants in the thin film, and D
represents the film thickness. The HP Labs group noted that "window
functions" were necessary to compensate for differences between
experimental measurements and their memristor model due to non-linear
ionic drift and boundary effects.
Operation as a switch
For
some memristors, applied current or voltage causes substantial change
in resistance. Such devices may be characterized as switches by
investigating the time and energy that must be spent to achieve a
desired change in resistance. This assumes that the applied voltage
remains constant. Solving for energy dissipation during a single
switching event reveals that for a memristor to switch from Ron to Roff in time Ton to Toff, the charge must change by ΔQ = Qon−Qoff.
Substituting V = I(q)M(q), and then ∫dq/V = ∆Q/V for constant VTo produces the final expression. This power characteristic differs fundamentally from that of a metal oxide semiconductor transistor,
which is capacitor-based. Unlike the transistor, the final state of the
memristor in terms of charge does not depend on bias voltage.
The type of memristor described by Williams ceases to be ideal after switching over its entire resistance range, creating hysteresis, also called the "hard-switching regime". Another kind of switch would have a cyclic M(q) so that each off-on event would be followed by an on-off event under constant bias. Such a device would act as a memristor under all conditions, but would be less practical.
Memristive systems
In the more general concept of an n-th order memristive system the defining equations are
where u(t) is an input signal, y(t) is an output signal, the vector x represents a set of n state variables describing the device, and g and f are continuous functions. For a current-controlled memristive system the signal u(t) represents the current signal i(t) and the signal y(t) represents the voltage signal v(t). For a voltage-controlled memristive system the signal u(t) represents the voltage signal v(t) and the signal y(t) represents the current signal i(t).
The pure memristor is a particular case of these equations, namely when x depends only on charge (x = q) and since the charge is related to the current via the time derivative dq/dt = i(t). Thus for pure memristors f (i.e. the rate of change of the state) must be equal or proportional to the current i(t) .
Pinched hysteresis
Example of pinched hysteresis curve, V versus I
One of the resulting properties of memristors and memristive systems is the existence of a pinched hysteresis effect. For a current-controlled memristive system, the input u(t) is the current i(t), the output y(t) is the voltage v(t),
and the slope of the curve represents the electrical resistance. The
change in slope of the pinched hysteresis curves demonstrates switching
between different resistance states which is a phenomenon central to ReRAM
and other forms of two-terminal resistance memory. At high frequencies,
memristive theory predicts the pinched hysteresis effect will
degenerate, resulting in a straight line representative of a linear
resistor. It has been proven that some types of non-crossing pinched
hysteresis curves (denoted Type-II) cannot be described by memristors.
Extended systems
Some
researchers have raised the question of the scientific legitimacy of
HP's memristor models in explaining the behavior of ReRAM. and have suggested extended memristive models to remedy perceived deficiencies.
One example
attempts to extend the memristive systems framework by including
dynamic systems incorporating higher-order derivatives of the input
signal u(t) as a series expansion
where m is a positive integer, u(t) is an input signal, y(t) is an output signal, the vector x represents a set of n state variables describing the device, and the functions g and f are continuous functions. This equation produces the same zero-crossing hysteresis curves as memristive systems but with a different frequency response than that predicted by memristive systems.
Another example suggests including an offset value to account for an observed nanobattery effect which violates the predicted zero-crossing pinched hysteresis effect.
Implementations
Titanium dioxide memristor
Interest in the memristor revived when an experimental solid-state version was reported by R. Stanley Williams of Hewlett Packard in 2007.
The article was the first to demonstrate that a solid-state device
could have the characteristics of a memristor based on the behavior of nanoscale
thin films. The device neither uses magnetic flux as the theoretical
memristor suggested, nor stores charge as a capacitor does, but instead
achieves a resistance dependent on the history of current.
Although not cited in HP's initial reports on their TiO2 memristor, the resistance switching characteristics of titanium dioxide were originally described in the 1960s.
The HP device is composed of a thin (50 nm) titanium dioxide film between two 5 nm thick electrodes, one titanium, the other platinum. Initially, there are two layers to the titanium dioxide film, one of which has a slight depletion of oxygen atoms. The oxygen vacancies act as charge carriers,
meaning that the depleted layer has a much lower resistance than the
non-depleted layer. When an electric field is applied, the oxygen
vacancies drift (see Fast ion conductor),
changing the boundary between the high-resistance and low-resistance
layers. Thus the resistance of the film as a whole is dependent on how
much charge has been passed through it in a particular direction, which
is reversible by changing the direction of current. Since the HP device displays fast ion conduction at nanoscale, it is considered a nanoionic device.
Memristance is displayed only when both the doped layer and
depleted layer contribute to resistance. When enough charge has passed
through the memristor that the ions can no longer move, the device
enters hysteresis. It ceases to integrate q=∫I dt, but rather keeps q at an upper bound and M fixed, thus acting as a constant resistor until current is reversed.
Memory applications of thin-film oxides had been an area of active investigation for some time. IBM published an article in 2000 regarding structures similar to that described by Williams. Samsung has a U.S. patent for oxide-vacancy based switches similar to that described by Williams. Williams also has a U.S. patent application related to the memristor construction.
In April 2010, HP labs announced that they had practical memristors working at 1 ns (~1 GHz) switching times and 3 nm by 3 nm sizes, which bodes well for the future of the technology. At these densities it could easily rival the current sub-25 nm flash memory technology.
Polymeric memristor
In
2004, Krieger and Spitzer described dynamic doping of polymer and
inorganic dielectric-like materials that improved the switching
characteristics and retention required to create functioning nonvolatile
memory cells.
They used a passive layer between electrode and active thin films,
which enhanced the extraction of ions from the electrode. It is possible
to use fast ion conductor as this passive layer, which allows a significant reduction of the ionic extraction field.
In July 2008, Erokhin and Fontana claimed to have developed a
polymeric memristor before the more recently announced titanium dioxide
memristor.
In 2010, Alibart, Gamrat, Vuillaume et al. introduced a new hybrid organic/nanoparticle device (the NOMFET : Nanoparticle Organic Memory Field Effect Transistor), which behaves as a memristor
and which exhibits the main behavior of a biological spiking synapse.
This device, also called a synapstor (synapse transistor), was used to
demonstrate a neuro-inspired circuit (associative memory showing a
pavlovian learning).
In 2012, Crupi, Pradhan and Tozer described a proof of concept
design to create neural synaptic memory circuits using organic ion-based
memristors. The synapse circuit demonstrated long-term potentiation
for learning as well as inactivity based forgetting. Using a grid of
circuits, a pattern of light was stored and later recalled. This mimics
the behavior of the V1 neurons in the primary visual cortex that act as spatiotemporal filters that process visual signals such as edges and moving lines.
Layered memristor
In 2014, Bessonov et al. reported a flexible memristive device comprising a MoOx/MoS2 heterostructure sandwiched between silver electrodes on a plastic foil. The fabrication method is entirely based on printing and solution-processing technologies using two-dimensional layered transition metal dichalcogenides (TMDs). The memristors are mechanically flexible, optically transparent
and produced at low cost. The memristive behaviour of switches was
found to be accompanied by a prominent memcapacitive effect. High
switching performance, demonstrated synaptic plasticity and
sustainability to mechanical deformations promise to emulate the
appealing characteristics of biological neural systems in novel
computing technologies.
Atomristor
Atomristor
is defined as the electrical devices showing memristive behavior in
atomically thin nanomaterials or atomic sheets. In 2018, Ge and Wu et
al. first reported a universal memristive effect in single-layer TMD (MX2,
M = Mo, W; and X = S, Se) atomic sheets based on vertical
metal-insulator-metal (MIM) device structure. These atomristors offer
forming-free switching and both unipolar and bipolar operation. The
switching behavior is found in single-crystalline and poly-crystalline
films, with various metallic electrodes (gold, silver and graphene).
Atomically thin TMD sheets are prepared via CVD/MOCVD,
enabling low-cost fabrication. Afterwards, taking advantage of the low
"on" resistance and large on/off ratio, a high-performance zero-power RF switch is proved based on MoS2 atomristors, indicating a new application of memristors.
Ferroelectric memristor
The ferroelectric memristor is based on a thin ferroelectric barrier sandwiched between two metallic electrodes. Switching the polarization of the ferroelectric
material by applying a positive or negative voltage across the junction
can lead to a two order of magnitude resistance variation: ROFF ≫ RON
(an effect called Tunnel Electro-Resistance). In general, the
polarization does not switch abruptly. The reversal occurs gradually
through the nucleation and growth of ferroelectric domains with opposite
polarization. During this process, the resistance is neither RON or ROFF,
but in between. When the voltage is cycled, the ferroelectric domain
configuration evolves, allowing a fine tuning of the resistance value.
The ferroelectric memristor's main advantages are that ferroelectric
domain dynamics can be tuned, offering a way to engineer the memristor
response, and that the resistance variations are due to purely
electronic phenomena, aiding device reliability, as no deep change to
the material structure is involved.
Carbon nanotube memristor
In 2013, Ageev, Blinov et al. reported observing memristor effect in structure based on vertically aligned carbon nanotubes studying bundles of CNT by scanning tunneling microscope.
Later it was found that CNT memristive switching is observed when a nanotube has a non-uniform elastic strain ΔL0.
It was shown that the memristive switching mechanism of strained СNT is
based on the formation and subsequent redistribution of non-uniform
elastic strain and piezoelectric field Edef in the nanotube under the influence of an external electric field E(x,t).
Biomolecular memristor
Biomaterials
have been evaluated for use in artificial synapses and have shown
potential for application in neuromorphic systems. In particular, the feasibility of using a collagen‐based biomemristor as an artificial synaptic device has been investigated,
whereas a synaptic device based on lignin demonstrated rising or
lowering current with consecutive voltage sweeps depending on the sign
of the voltage furthermore a natural silk fibroin demonstrated memristive properties; spin-memristive systems based on biomolecules are also being studied.
Spin memristive systems
Spintronic memristor
Chen and Wang, researchers at disk-drive manufacturer Seagate Technology described three examples of possible magnetic memristors.
In one device resistance occurs when the spin of electrons in one
section of the device points in a different direction from those in
another section, creating a "domain wall", a boundary between the two
sections. Electrons flowing into the device have a certain spin, which
alters the device's magnetization state. Changing the magnetization, in
turn, moves the domain wall and changes the resistance. The work's
significance led to an interview by IEEE Spectrum. A first experimental proof of the spintronic memristor based on domain wall motion by spin currents in a magnetic tunnel junction was given in 2011.
Memristance in a magnetic tunnel junction
The magnetic tunnel junction
has been proposed to act as a memristor through several potentially
complementary mechanisms, both extrinsic (redox reactions, charge
trapping/detrapping and electromigration within the barrier) and
intrinsic (spin-transfer torque).
Extrinsic mechanism
Based on research performed between 1999 and 2003, Bowen et al. published experiments in 2006 on a magnetic tunnel junction (MTJ) endowed with bi-stable spin-dependent states (resistive switching).
The MTJ consists in a SrTiO3 (STO) tunnel barrier that separates half-metallic oxide
LSMO and ferromagnetic metal CoCr electrodes. The MTJ's usual two
device resistance states, characterized by a parallel or antiparallel
alignment of electrode magnetization, are altered by applying an
electric field. When the electric field is applied from the CoCr to the
LSMO electrode, the tunnel magnetoresistance
(TMR) ratio is positive. When the direction of electric field is
reversed, the TMR is negative. In both cases, large amplitudes of TMR on
the order of 30% are found. Since a fully spin-polarized current flows
from the half-metallic LSMO electrode, within the Julliere model,
this sign change suggests a sign change in the effective spin
polarization of the STO/CoCr interface. The origin to this multistate
effect lies with the observed migration of Cr into the barrier and its
state of oxidation. The sign change of TMR can originate from
modifications to the STO/CoCr interface density of states, as well as
from changes to the tunneling landscape at the STO/CoCr interface
induced by CrOx redox reactions.
Reports on MgO-based memristive switching within MgO-based MTJs appeared starting in 2008
and 2009.
While the drift of oxygen vacancies within the insulating MgO layer has
been proposed to describe the observed memristive effects, another explanation could be charge trapping/detrapping on the localized states of oxygen vacancies
and its impact
on spintronics. This highlights the importance of understanding what
role oxygen vacancies play in the memristive operation of devices that
deploy complex oxides with an intrinsic property such as
ferroelectricity or multiferroicity.
Intrinsic mechanism
The magnetization state of a MTJ can be controlled by Spin-transfer torque,
and can thus, through this intrinsic physical mechanism, exhibit
memristive behavior. This spin torque is induced by current flowing
through the junction, and leads to an efficient means of achieving a MRAM.
However, the length of time the current flows through the junction
determines the amount of current needed, i.e., charge is the key
variable.
The combination of intrinsic (spin-transfer torque) and extrinsic
(resistive switching) mechanisms naturally leads to a second-order
memristive system described by the state vector x = (x1,x2), where x1 describes the magnetic state of the electrodes and x2 denotes the resistive state of the MgO barrier. In this case the change of x1 is current-controlled (spin torque is due to a high current density) whereas the change of x2
is voltage-controlled (the drift of oxygen vacancies is due to high
electric fields). The presence of both effects in a memristive magnetic
tunnel junction led to the idea of a nanoscopic synapse-neuron system.
Spin memristive system
A fundamentally different mechanism for memristive behavior has been proposed by Pershin and Di Ventra.
The authors show that certain types of semiconductor spintronic
structures belong to a broad class of memristive systems as defined by
Chua and Kang.
The mechanism of memristive behavior in such structures is based
entirely on the electron spin degree of freedom which allows for a more
convenient control than the ionic transport in nanostructures. When an
external control parameter (such as voltage) is changed, the adjustment
of electron spin polarization is delayed because of the diffusion and
relaxation processes causing hysteresis. This result was anticipated in
the study of spin extraction at semiconductor/ferromagnet interfaces,
but was not described in terms of memristive behavior. On a short time
scale, these structures behave almost as an ideal memristor.
This result broadens the possible range of applications of
semiconductor spintronics and makes a step forward in future practical
applications.
Self-directed channel memristor
In 2017, Dr Kris Campbell formally introduced the self-directed channel (SDC) memristor.
The SDC device is the first memristive device available commercially to
researchers, students and electronics enthusiast worldwide.
The SDC device is operational immediately after fabrication. In the Ge2Se3 active layer, Ge-Ge homopolar bonds are found and switching occurs. The three layers consisting of Ge2Se3/Ag/Ge2Se3,
directly below the top tungsten electrode, mix together during
deposition and jointly form the silver-source layer. A layer of SnSe is
between these two layers ensuring that the silver-source layer is not in
direct contact with the active layer. Since silver does not migrate
into the active layer at high temperatures, and the active layer
maintains a high glass transition temperature of about 350 °C (662 °F),
the device has significantly higher processing and operating
temperatures at 250 °C (482 °F) and at least 150 °C (302 °F),
respectively. These processing and operating temperatures are higher
than most ion-conducting chalcogenide device types, including the
S-based glasses (e.g. GeS) that need to be photodoped or thermally
annealed. These factors allow the SDC device to operate over a wide
range of temperatures, including long-term continuous operation at
150 °C (302 °F).
Potential applications
Memristors
remain a laboratory curiosity, as yet made in insufficient numbers to
gain any commercial applications. Despite this lack of mass
availability, according to Allied Market Research the memristor market
was worth $3.2 million in 2015 and will be worth $79.0 million by 2022.
A potential application of memristors is in analog memories for superconducting quantum computers.
Memristors can potentially be fashioned into non-volatile solid-state memory, which could allow greater data density than hard drives with access times similar to DRAM, replacing both components. HP prototyped a crossbar latch memory that can fit 100 gigabits in a square centimeter, and proposed a scalable 3D design (consisting of up to 1000 layers or 1 petabit per cm3). In May 2008 HP reported that its device reaches currently about one-tenth the speed of DRAM. The devices' resistance would be read with alternating current so that the stored value would not be affected.
In May 2012, it was reported that the access time had been improved to
90 nanoseconds, which is nearly one hundred times faster than the
contemporaneous Flash memory. At the same time, the energy consumption
was just one percent of that consumed by Flash memory.
Memristor have applications in programmable logic, signal processing, Super-resolution imaging, physical neural networks, control systems, reconfigurable computing, brain–computer interfaces, and RFID.
Memristive devices are potentially used for stateful logic implication,
allowing a replacement for CMOS-based logic computation. Several early works have been reported in this direction.
In 2009, a simple electronic circuit consisting of an LC network and a memristor was used to model experiments on adaptive behavior of unicellular organisms.
It was shown that subjected to a train of periodic pulses, the circuit
learns and anticipates the next pulse similar to the behavior of slime
molds Physarum polycephalum where the viscosity of channels in the cytoplasm responds to periodic environment changes. Applications of such circuits may include, e.g., pattern recognition. The DARPA SyNAPSE project funded HP Labs, in collaboration with the Boston University Neuromorphics Lab, has been developing neuromorphic architectures which may be based on memristive systems. In 2010, Versace and Chandler described the MoNETA (Modular Neural Exploring Traveling Agent) model.
MoNETA is the first large-scale neural network model to implement
whole-brain circuits to power a virtual and robotic agent using
memristive hardware.
Application of the memristor crossbar structure in the construction of
an analog soft computing system was demonstrated by Merrikh-Bayat and
Shouraki. In 2011, they showed how memristor crossbars can be combined with fuzzy logic to create an analog memristive neuro-fuzzy computing system with fuzzy input and output terminals. Learning is based on the creation of fuzzy relations inspired from Hebbian learning rule.
In 2013 Leon Chua published a tutorial underlining the broad span
of complex phenomena and applications that memristors span and how they
can be used as non-volatile analog memories and can mimic classic
habituation and learning phenomena.
Derivative devices
Memistor and memtransistor
The memistor and memtransistor are transistor based devices which include memristor function.
Memcapacitors and meminductors
In 2009, Di Ventra, Pershin, and Chua extended
the notion of memristive systems to capacitive and inductive elements
in the form of memcapacitors and meminductors, whose properties depend
on the state and history of the system, further extended in 2013 by Di
Ventra and Pershin.
Memfractance and memfractor, 2nd- and 3rd-order memristor, memcapacitor and meminductor
In September 2014, Mohamed-Salah Abdelouahab, Rene Lozi, and Leon Chua published a general theory of 1st-, 2nd-, 3rd-, and nth-order memristive elements using fractional derivatives.
History
Precursors
Sir Humphry Davy is said by some to have performed the first experiments which can be explained by memristor effects as long ago as 1808. However the first device of a related nature to be constructed was the memistor (i.e. memory resistor), a term coined in 1960 by Bernard Widrow to describe a circuit element of an early artificial neural network called ADALINE. A few years later, in 1968, Argall published an article showing the resistance switching effects of TiO2 which was later claimed by researchers from Hewlett Packard to be evidence of a memristor.
Theoretical description
Leon Chua
postulated his new two-terminal circuit element in 1971. It was
characterized by a relationship between charge and flux linkage as a
fourth fundamental circuit element.
Five years later he and his student Sung Mo Kang generalized the theory
of memristors and memristive systems including a property of zero
crossing in the Lissajous curve characterizing current vs. voltage behavior.
Twenty-first century
On May 1, 2008, Strukov, Snider, Stewart, and Williams published an article in Nature identifying a link between the 2-terminal resistance switching behavior found in nanoscale systems and memristors.
On January 23, 2009, Di Ventra, Pershin, and Chua extended the notion of memristive systems to capacitive and inductive elements, namely capacitors and inductors, whose properties depend on the state and history of the system.
In July 2014, the MeMOSat/LabOSat group (composed of researchers from Universidad Nacional de General San Martín (Argentina), INTI, CNEA, and CONICET) put memory devices into orbit for their study at LEO. Since then, seven missions with different devices are performing experiments in low orbit, onboard Satellogic's Ñu-Sat satellites.
On July 7, 2015 Knowm Inc announced Self Directed Channel (SDC) memristors commercially.
These devices remain available in small numbers.
On July 13, 2018 MemSat (Memristor Satellite) was launched to fly a memristor evaluation payload.